A Vertical Outlier Detection Method with Clusters as By-product

Authors

Imad Rahal, College of Saint Benedict/Saint John's UniversityFollow

Document Type

Conference Proceeding

Publication Date

2004

Disciplines

Computer Sciences

Recommended Citation

Rahal, Imad. 2004. "A Vertical Outlier Detection Method with Clusters as By-product." In Proceedings of the IEEE ICTAI, International Conference on Tools with Artificial Intelligence, (Boca Raton, Florida), 22-29.